Three-Dimensional Reconstruction Using an Ultrahigh-Voltage Electron Microscope
Zhang Haibo¹, Takaoka Akio²
(1. Xi'an  Jiaotong University, Xi'an 710049, China; 2. Osaka University,Japan)

Abstract: This work is concerned with the reconstruction using an ultrahigh-voltage electron microscope(Ultra-HVEM) that makes electron tomography.Tomographic experiment at an accelerated voltage of 2MV is reported for the first time. In image processing, correction is made for the magnification and image-rotation alteration due to the specimen height change for single-axis tilting.Presented is an alignment technique using the difference of two projection images. The three-dimensional reconstruction of escherichia coli shows that Ultra-HVEM tomography is effective for thick specimens. It is expected that application could be extended to biology and material science.
Keywords: high-voltage electron microscopy;three-dimensional reconstruction;computerized tomography;image processing