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Artificial Neural Network Applied to Eddy Current Nondestructive Testing
Sun Xiaoyun, Yuan Bin, Sheng Jianni
(Xi'an Jiaotong  University, Xi'an 710049, China)
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Abstract: Artificial neural network(ANN)is applied to eddy current nondestructive testing( ECNT) for detecting defects. After establishing the correlation between the amplitude or phase with the defect size, phase value was found to correlate better with the depth of defect. Wavelet edge detecting method can be used finding free edges. The results were used as inputs to ANN for analysis.
Keywords: artificial neural netwrk; ECNT; wavelet edge detecting